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< More White Papers & Application Notes
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WHITE PAPER: Semiconductor Inspection Using The CRONUS-2P Laser (2/20/2024)
WHITE PAPER: Semiconductor Inspection Using The CRONUS-2P Laser
Inspection plays a critical role in today’s semiconductor manufacturing.
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Tuesday, February 20, 2024
WHITE PAPERS & APPLICATION NOTES
Semiconductor Inspection Using the CRONUS-2P Laser
Inspection plays a critical role in today’s semiconductor manufacturing. Nonlinear optical techniques present compelling advantages, but require lasers producing femtosecond pulses at adjustable wavelengths. Here, we discuss the application of
Light Conversion’s
CRONUS-2P femtosecond laser for pump-probe imaging of wafers using the ultrafast microscope developed by
MONSTR Sense Technologies
, utilizing nonlinear imaging to detect defects in raw materials and devices.
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