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Photonics Products Sensing & Detection Laser Beam Profilers Camera

X-ray Beam Profiler µBIP

About Star Tech Instruments Inc.

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Type: Camera
Wavelength Range: 1nm - 400nm
Max. Beam Diameter: 25mm
Spot Size: 25µm
Compatible Sources: CW, Pulsed
Interface: USB 2.0, USB 3.0
Wavelength: 1 nm
High Damage Threshold: 5 W/cm2
Vacuum: 10-9 torr

High resolution x-ray beam profiler with vacuum flange to 10-9 torr.

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