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X-ray Beam Profiler µBIP

  • Company: Star Tech Instruments Inc.
  • Type: Camera
  • Wavelength Range: 1nm - 400nm
  • Max. Beam Diameter: 25mm
  • Spot Size: 25µm
  • Compatible Sources: CW, Pulsed
  • Interface: USB 2.0, USB 3.0
  • Wavelength: 1 nm
  • High Damage Threshold: 5 W/cm2
  • Vacuum: 10-9 torr

High resolution x-ray beam profiler with vacuum flange to 10-9 torr.
X-ray Beam Profiler µBIP

Star Tech Instruments Inc.
PO Box 1822
New Fairfield, CT 06812
United States
Phone: +1 203-312-0767
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