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HELIOS

  • Company: Ultrafast Systems
  • Type: Benchtop
  • Measurement Techniques: Absorption
  • Spectral Range (nm): 320 - 2400
  • Max. Resolution (nm): 2
  • Pixel Count (total pixels): 2048
  • Width: 457mm
  • Length: 915mm
  • Height: 250mm
  • Applications: Biomedical/Medical, Scientific Research, Semiconductor, Other
  • Time window (Optical delay line): 8 ns
  • Sample area: 225 mm × 250 mm
  • Pump beam diameter: ≤ 9 mm
  • Probe reference: optional
  • Temporal resolution resolution: ≤ 150 fs

Femtosecond Transient Absorption Spectrometer

Fully automated design.
Laser source: Ti:Sapphire or Yb lasers, OPA optionally.
Patented automated beam alignment system (Patent No.: US 10,209,131).
HELIOS

Ultrafast Systems
8330 Consumer Court
Sarasota, FL 34240
United States
Phone: +1 941-360-2161
Fax: +1 866-668-9926
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