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XperRAM S Series

  • Company: Nanobase Inc.
  • Type: System
  • Spectrometer Focal Length: 200 mm
  • Signal-to-noise Ratio: 46
  • Raman Peak Efficiency: ≥ 90%
  • Active Pixels (detector): 2000 × 256 pixels
  • Scanning Positioning Accuracy: ≤ 1µm
  • Scanning Size: 200 × 200 µm

Nanobase’s XperRAM S Raman microscope is designed to provide researchers with precise spectrum peak acquisition, wide area image scanning, and an easy-to-control software suite. The microscope features a transmission spectrometer to increase spectrum peak efficiency to over 90%, and a wide and fast image scanning experience for over 200 μm × 200 μm.

Nanobase Inc.
#1406-1, 196 Gasan-digital-1-ro
Geumcheon-gu
Seoul 08502
South Korea
Phone: +82 7 086 660233
Fax: +82 2 852 9013
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