Request InfoLabsphere Inc.A system that measures the optical and electrical properties of VCSEL wafers has been designed by Labsphere Inc. and Karl Suss America Inc. Designed for high-speed characterization, this turnkey system uses a Spectralon integrating sphere that minimizes sensitivity to beam alignment and divergence and that eliminates reflections that damage the device under test. Measurements include L-I-V curves, optical power, peak wavelength, full width half maximum, kink voltage and current curves, and spectral analysis. The system accepts wafers and substrates up to 200 mm in diameter and provides...See full productRelated content from Photonics MediaWEBINARSPhotonics.com 6/30/2021European Photonics Manufacturing Services Funded by ECThis event is supported by the European initiatives presented and is moderated by EPIC, the European Photonics Industry Consortium. The European Commission is helping companies access the...Photonics.com 7/20/2023Motorized and Calibrated Lenses for Machine Vision ApplicationsMany applications have benefited from motorized varifocal lenses that allow automatic or remote adjustment of focus distance and field of view. Applications may need to change the focal length or...Photonics.com 1/9/2023Innovations in Ultrashort-Pulse and RF-Excited CO2 Lasers Expand Materials Processing ApplicationsIndustrial laser materials processing is constantly evolving. Industries as varied as pharmaceutical, consumer electronics, automotive, aerospace, and textiles, among others, have benefited from new...Photonics.com 1/18/2018Fiberguide RARe Motheye Fiber: Random Anti-Reflective (RARe) Nanostructures on Optical Fibers as Replacement for AR CoatingsAnti-reflective (AR) coatings are now entering their second century and have remained virtually unchanged throughout their life. As power level and wavelength range requirements continue to increase,...