Jan 2002PerkinElmer InstrumentsRequest Info
Designed to complement imaging techniques such as scanning electron microscopy, the Spectrum Spotlight 300 features Duet detector technology that eliminates the need for step-scan data collection and that operates over a wide wavelength range. PerkinElmer Instruments says its imaging system reduces analysis time from hours to minutes. It features Fourier transform infrared (FTIR) microscopy capabilities, faster imaging, advanced graphics and a simple setup. An integrated suite of software tools enables identification of small differences in chemical content and provides information about defects, impurities and composition from all sample types.