Feb 2002McPhersonRequest Info
McPherson Inc. has introduced a spectral reflectometer designed for measuring the absorbance, transmittance and reflectance of diverse optical samples. Units are available for the vacuum, extreme-UV and UV-VIS-IR. The stainless steel device can handle samples up to 350 mm in diameter, which can be measured from 5° to 180° with corresponding detector angles from 10° to 180°. The reflectometer, which is available with an integrating sphere for diffuse measurements, is suitable for use in vacuum, purged or atmospheric environments. It provides spectral analysis better than ±0.1% with variable wavelength resolution from 0.01 to 8 nm.