Request InfoJEOL USA Inc.Nanometer-scale imaging is provid-ed by JEOL USA Inc.'s JSM-7400F scanning electron microscope. The device achieves 1.5-nm resolution at 1 kV. It features a patented scanning electron enhancer for improved contrast quality of surface structures, an r-filter for suppressing the electron charge on nonconductive specimens and an in-lens backscatter detector. Flexible analytical geometry enables a working distance of 8 mm at a takeoff angle of 35°. Load lock options allow coverage of samples up to 100, 150 or 200 mm in diameter, and three motorized eucentric stages with five-axis automation...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 9/21/2023Widefield Stereo MicroscopeThe Model FX-3 from Titan Tool Supply Inc. is an industrial-grade widefield stereo microscope designed to facilitate various manufacturing and quality assurance remote visual inspection tasks. 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Two-dimensional FPAs (InGaAs, InSb, and MCT) and Integrated Dewar Cooler Assemblies (IDCAs)...Photonics Buyers' GuideBAE Systems Sensor SolutionsExpanding upon the storied Fairchild Imaging legacy, we offer a wide range of imaging devices that provide our customers with top performance and key features for the most demanding applications. Our...