LASER DIODE TESTING
Oct 2002Keithley Instruments Inc.Request Info
Keithley Instruments Inc.'s model 2520INT integrating sphere photodetector is designed for use with the model 2520 pulsed laser diode test system for light-current-voltage production testing of 980- and 1480-nm EDFA pump lasers, Raman amplifiers, telecommunications laser diodes and high-power vertical-cavity surface-emitting lasers. The company says these devices provide accurate measurements of optical power at the wafer, bar or chip level before integration into complete temperature-controlled laser diode modules. The 2520INT has a 1-in. sphere with a germanium detector and uses an SMA fiber tap to allow measured light to be sent to another instrument for additional measurements. It can handle pulse widths as short as 500 ns and operating wavelength ranges of 700 to 1700 nm.