OPTICAL SYSTEMS TESTING
Dec 2002Luna TechnologiesRequest Info
OVA ST optical vector analyzers from Luna Technologies are designed to measure insertion loss, polarization-dependent loss, group delay, chromatic dispersion, polarization mode dispersion and optical phase in systems and subsystems up to 80 m long. With measurements based on optical phase data, the devices can scan entire backplanes or modules made of multiple components, identifying errors and eliminating unknowns prior to the final system test. In addition, they provide increased device-under-test length.