Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

WAFER INSPECTION

Photonics Spectra
Mar 2003
Rudolph Technologies Inc.Request Info
 
Wafer Inspection An automated inspection system for 200- and 300-mm wafers has been released by Rudolph Technologies Inc. The WaferView provides macrodefect inspection of wafer surfaces at throughputs of >100 wafers per hour. The company says the system's proprietary full-color image processing detects 95% of photolithography defects and correctly classifies them 85% of the time. The WaferView has a library of classified defects and can be programmed with new defect classes, enabling users to customize defect detection.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!