Jun 2003nPoint Inc.Request Info
ProbeMax carbon nanotube atomic force microscope tips from nPoint Inc. include a scanning electron microscope image, which enables users to select the appropriate probe for each application. The company says the tips have a high aspect ratio and a nanometer-scale diameter for accurate high-resolution imaging of deep surface features in semiconductor applications. The ProbeMax probes include multiwall carbon nanotubes or bundles of nanotubes mounted on silicon atomic force microscope probes. They can be used to replace silicon probe tips in intermittent-contact mode applications.