Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

WAFER, FILTER INSPECTION

Photonics Spectra
Jan 2004
Olympus Soft Imaging Solutions Corp.Request Info
 
Soft Imaging System Corp. has introduced image analysis software for inspecting blank wafers and circular filters. AnalySis waferInspec-tor and analySis filterInspector perform fully automatic and fast analysis, classification and documentation of contamination and defects on residues and coatings. Special cameras and motorized stage controllers enable characterization of a 50-mm-diameter filter in 15 min, with 0.8-µm resolution. Inspection parameters are user-selected, and a report containing measurement results, histograms and sample data is generated and saved in the database. Wafer and particle maps also are generated, and a digital rendering of each wafer is saved.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!
X
Are you interested in this product?
If you'd like Olympus Soft Imaging Solutions Corp. to reach out to you with more information about this product, please supply your email and they will contact you.

Email Address:
Stop showing me this for the remainder of my visit