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SCANNING CONTROL

Photonics Spectra
May 2004
nPoint Inc.Request Info
 
An improved scanning control mode has been introduced by nPoint Inc. for its atomic force microscopes and nanopositioning stages used in research and manufacturing. It incorporates digital signal processing for precision response at high scan speeds and produces minimal phase lag between the commanded and the achieved position. The new mode is available for all of the company's nanopositioning stages, including the iC AFM upgrade kit, which provides closed-loop control and metrology capability to scanning probe instruments.


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GLOSSARY
metrology
The science of measurement, particularly of lengths and angles.
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