Request InfoFilmetrics, KLA InstrumentsThe F50 thin-film mapping system unveiled by Filmetrics Inc. measures thickness and optical constants of films between 100 Å and 450 µm and also can measure refractive index. It performs 89-point mappings in <1 min. The system illuminates the sample with white light and measures the reflectance spectrum off the film, and software analyzes the spectrum to determine thickness, optical constants and other user-selectable parameters. Wavelength range is between 220 and 1700 nm.See full productRelated content from Photonics MediaPRODUCTSPromoted Content May 2023 IssueLasers and Component SpectrometersMetrohm has opened a new webshop for lasers, component spectrometers, and Raman spectroscopy sampling solutions. 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