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Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB

MACRO IMAGING SYSTEM

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MACRO IMAGING SYSTEM The LC-PolScope macro imaging system from Cambridge Research & Instrumentation (CRI) Inc. is designed to measure retardance and slow-axis orientation of a 40 × 30-mm sample in less than 3 s. The system provides a method for measuring and analyzing low-level birefringence in samples with 0.02-nm sensitivity. It automates the process of quantitative birefringence metrology, allowing the user to calculate retardance magnitude and orientation at every pixel within seconds. The instrument can be used to measure stress in glass, glass-to-metal interfaces, optical materials, disks, thin films, polymers, fibers and biological specimens. A microscopic system also is available.


Published: November 2004
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birefringenceCambridge Research &disksfibersglassglass-to-metal interfacesImagingInstrumentation (CRI) Inc.macro imaging systemmetrologyNew Productsoptical materialspolymersthin films

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