Nov 2004Solarius Development Inc.Request Info
The Sensofar noncontact optical imaging profiler announced by Solarius Development Inc. uses proprietary technology to obtain a fast, noninvasive assessment of the micro- and nanogeometry of technical surfaces. The sensor head combines confocal and interferometry techniques to measure steep slopes, rough and low reflective surfaces, and samples containing dissimilar materials. It can be used from the stand setup for R&D and quality inspection laboratories, or configured as a manipulator or robot-driven system for online process control. An integrated system controller performs image processing and controls the sensor's position.