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ATOMIC FORCE MICROSCOPY

Photonics Spectra
Mar 2005
Veeco Instruments Inc.Request Info
 
The NanoMan II atomic force microscope from Veeco Instruments Inc. can perform high-accuracy force curves, nanoindenting and pulling techniques, and other nanoscience research. Featuring a patented Hybrid XYZ scanner, the device operates in closed-loop mode in all three axes, making it suitable for nanolithography, nanomanipulation, and imaging in materials and life sciences applications. Its integral flexure design ensures that the Z-axis remains orthogonal to the X-Y plane, and offers increased Z-height accuracy and repeatability. The microscope provides up to six times lower Z-sensor noise and precise X-Y control for molecule manipulation.


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atomic force microscopeBasic ScienceimagingindustrialMicroscopynanolithographynanomanipulationNew ProductsSensors & DetectorsVeeco Instruments Inc.

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