Jul 2005Princeton InstrumentsRequest Info
Princeton Gamma-Tech's latest release of Spirit software for microanalysis allows the user to overlay any number of high-contrast element maps with a high-resolution scanning electron microscope image to produce detailed images. X-ray maps build on the screen with each scan, increasing acquisition speed and revealing the elemental composition of the sample. Analysis can be started before acquisition is finished, so samples can be rapidly screened for points of interest. Line profiling, area spectra, and Quant and phase maps are accessible with a mouse click, and reports are automatically generated in Microsoft Word and Excel.