Request InfoOxford Instruments Asylum ResearchAsylum Research has introduced the MFP-3D extended scan head for use with its MFP-3D atomic force microscopy systems. The scan head contains an extra piezo stack that enables an increased scan range of 28 µm along the Z-axis for samples with high features, and for such bioscience applications as live-cell and plant imaging, and for pulling on long-chained molecules. It incorporates the companys nanopositioning sensors, which provide a Z-sensor noise of <0.3 nm Allan deviation (Adev) and a Z-height noise of <0.06 nm Adev in a bandwidth from 0.1 Hz to 1 kHz. 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