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Photonics Spectra
Dec 2005
Veeco Instruments Inc.Request Info
Veeco Instruments Inc.’s conductive atomic force microscope (AFM) and scanning capacitance microscope (SCM) add-on application modules extend the performance capabilities of its CP-II scanning probe microscope. The conductive AFM can analyze variations in film thickness, locate electrical defects and map the electrical properties of materials. It also enables measurement of local current voltage or current-force spectra. The SCM measures variations in carrier concentration on silicon and compound semiconductor structures, making it useful in the development, manufacture, testing and failure analysis of semiconductors. It also enables electrostatic force microscopy and surface potential imaging. The company says that both modules offer high performance and low noise.


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atomic force microscopeBasic ScienceMicroscopyNew Productsscanning capacitance microscope (SCM)Veeco Instruments Inc.

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