Request InfoVeeco Instruments Inc.Veeco Instruments Inc.’s conductive atomic force microscope (AFM) and scanning capacitance microscope (SCM) add-on application modules extend the performance capabilities of its CP-II scanning probe microscope. The conductive AFM can analyze variations in film thickness, locate electrical defects and map the electrical properties of materials. It also enables measurement of local current voltage or current-force spectra. The SCM measures variations in carrier concentration on silicon and compound semiconductor structures, making it useful in the development, manufacture, testing and...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Jul/Aug 2022 IssueMicroscopy SystemThe Lattice Lightsheet 7 microscopy system from ZEISS provides sample-preserving, long-term imaging of living cells. 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