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MEASURING SYSTEM

Photonics Spectra
Jan 2006
Ono Sokki Technology Inc., Test & Measurement Div.Request Info
 
MEASURING SYSTEM The CL-2400, a noncontact thickness measuring system offered by Ono Sokki Technology Inc., is for conductive and semiconductive materials. It calculates the thickness from gap capacitance, a method that the company says provides high accuracy and stability and that is immune to magnetic fields and ambient light. Built-in self-calibrating software requires calibration only every three years, and a large seven-segment LED display provides easy reading. The system can measure thicknesses of up to 4 in. with submicron accuracy and is supplied with RS-232C output for interfacing to a PC or data acquisition system. Response speed for in-line applications is 20 ms.


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conductiveNew Productsnoncontact thickness measuring systemOno Sokki Technology Inc.semiconductive materials

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