OLS3000 LEXT Microscope
Jun 2006Olympus Scientific Solutions Americas, Industrial MicroscopesRequest Info
ORANGEBURG, N.Y., June 19, 2006 -- A new laser confocal technology has been announced by Olympus
Micro-Imaging that the company said fills the gap between conventional
high resolution optical microscopes and scanning electron microscopes
LEXT for laser scanning confocal technology, it is designed for
applications requiring ultraprecise measurement and observation, such
as microelectromechanical systems fabrication, advanced materials
processing, nanoscale production and semiconductor wafer manufacturing.
The new technology, introduced in the OLS3000 LEXT microimaging system,
features sub-micron imaging with 0.12 µm and 0.01 µm Z resolution and
accurate three-dimensional measurement capability.
To speed up
measurement and observation tasks in high volume manufacturing
applications, the OLS3000 requires no sample preparation or vacuum
pumpdown -- samples can be placed directly on the microscope stage for
both three-dimensional observation and measurement in real time.
Magnification power from 120X to 14,400X is ideal for researchers
working between the limits of conventional optical microscopes and
SEMs. The new LEXT microscopes enable every user to make quicker, more
accurate sample analyses, all based on strict traceability systems,
Olympus Micro-Imaging said.
Because the LEXT microscope uses a
laser for pinpoint surface profile measurements, resolution much higher
than conventional optical microscopes can be obtained with just as many
different observation methods. Brightfield, darkfield and differential
interference contrast (DIC) microscopy techniques are possible in
both white light and laser confocal imaging modes. The new confocal
laser DIC mode is especially useful for highlighting subtle textural
variations during surface analysis.
Olympus Micro-Imaging has
also introduced the LEXT-IR, a near-infrared system operating at a
wavelength of 1310 nm for nondestructive, high-resolution observation
and measurement through silicon materials. For more information, visit:
www.olympusmicroimaging.com; e-mail: firstname.lastname@example.org
Olympus Surgical & Industrial America Inc.
One Corporate Dr.
Orangeburg, NY 10962
Phone: (845) 398-9400
Fax: (845) 398-9444
Web site: www.olympusmicroimaging.com