Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

THIN-FILM METROLOGY

Photonics Spectra
Jul 2006
Semiconsoft Inc.Request Info
 
Available from Semiconsoft Inc., TFCompanion 3.0 is a powerful software package for thin-film metrology applications, including semiconductors and biotechnology. This version fully supports imaging ellipsometry and reflectometry data analysis as well as image processing and analysis features for biochip applications. The software enables users to select feature sets relevant to their application requirements, and it now offers integrated data acquisition and control for spectrometers from Ocean Optics Inc. and Avantes Inc. It also supports measurement of thick, transparent substrates, such as those found on LCDs and solar cells. Network-integrated and OEM versions are available.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
biotechnologyenergymetrologyNew ProductssemiconductorsSemiconsoft Inc.spectroscopythin-film metrology applications

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!
X
Are you interested in this product?
If you'd like Semiconsoft Inc. to reach out to you with more information about this product, please supply your email and they will contact you.

Email Address:
Stop showing me this for the remainder of my visit