Request InfoVeeco Instruments Inc.The NanoScope V extends Veeco Instruments Inc.’s range of scanning probe microscope (SPM) systems. The device achieves reliable high-speed data acquisition of high-density images of 5120 × 5120 pixels. Eight images can be simultaneously captured and displayed, with improved signal-to-noise ratio. With three independent lock-in amplifiers, the controller provides thermal tune measurements of cantilever resonances up to 2 MHz. It affords easy access to most input and output signals through front-panel BNCs and handles data input from an external source. 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