IX-70 ChromAblate Inspection System
Dec 2006IPG Photonics, Microsystems Div.Request Info
HOLLIS, N.H., Dec. 8, 2006 -- The IX-70 ChromAblate on-target inspection and short-deletion system from J P Sercel Associates (JPSA) delivers high precision and high power in a small package. The laser-based materials processing system has a compact benchtop configuration and high degree of flexibility that make it suitable for a wide variety of applications and for touch-ups, the manufacturer said.
Developed for the repair of flat-panel displays, microcircuits and wafers, the IX-70 can be applied to a variety of micromachining applications and can be configured with infrared, visible or ultraviolet wavelengths to process materials including metals and polymers.
Precise control of the laser power is achieved through an integrated adjustable attenuator. Various geometric shapes can be projected onto the work surface through an adjustable aperture for square or rectangular features, and an optional mask indexing wheel can be used for round or other feature shapes. For alignment and inspection of the work surface, the IX-70 incorporates a coaxial high-resolution CCD camera, adjustable zoom lens and an LCD display for real-time process viewing.
The IX-70 is available in multiple wavelengths and offers high power for its size: up to 90 mJ at 1064 nm, 50mJ at 532nm, 11 mJ at 355 nm or 10 mJ at 266 nm. Its non-ontact technique provides 24/7 maintenance-free operation, JPSA said.
Tthe IX-70 is also available in a gantry-mounted version for large flat-panel display repair.
For more information, visit: www.jpsalaser.com; e-mail: email@example.com
J P Sercel Associates
17D Clinton Dr.
Hollis, NH 03049
Phone: (603) 595-7048
Fax: (603) 598-3835