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JSM-7001F Analytical SEM
Mar 2007
JEOL USA Inc.Request Info
PEABODY, Mass., March 13, 2007 -- The JSM-7001F, a new thermal field-emission analytical scanning electron microscope (SEM) from electron optical product maker JEOL USA, acquires high-resolution micrographs at up to 1,000,000X magnification for applications ranging from semiconductors, metals, minerals, materials and ceramics to nonconductive biological samples.

JEOL-JSM-7001F.jpgThe JSM-7001F features a unique in-lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for characterization of nanostructures with a resolution of 1.2 nm at 30 kV. According to JEOL, the JSM-7001F is ideal for low accelerating voltage x-ray spectroscopy and crystallography at and below the 100-nm scale.

The large specimen chamber -- designed for samples up to 200 mm in diameter -- accommodates a wide variety of detectors simultaneously. These include multiple EDS, WDS, EBSD, scanning transmission electron microscope (STEM), BSE, CL, EBIC, and infrared camera. The SEM can also be equipped as a dual-column focused ion beam or an electron-beam lithography tool.

The SEM comes with a choice of three stage sizes and exchange chambers, and a new 5-axis automated stage. The JSM-7001F can be configured for both high-vacuum and low-vacuum operation.

A new Windows XP-based computer interface allows for unprecedented ease of operation and image analysis. Users can choose to display up to four live images on the screen, as well as live signal mixing.

As with all electron optics products sold at JEOL USA, four days of training at the JEOL Institute in Peabody, Mass. are included in the purchase of the JSM-7001F, allowing the new user to optimize performance of this instrument for their applications.

For more information, visit:; e-mail:

11 Dearborn Rd.
Peabody, MA 01960
Phone: (978) 535-5900
Fax: (978) 536-2205


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The analysis of the atomic structures within crystals by means of x-ray diffraction.
A charged elementary particle of an atom; the term is most commonly used in reference to the negatively charged particle called a negatron. Its mass at rest is me = 9.109558 x 10-31 kg, its charge is 1.6021917 x 10-19 C, and its spin quantum number is 1/2. Its positive counterpart is called a positron, and possesses the same characteristics, except for the reversal of the charge.
A graphic reproduction of an object formed by a microscope or another optical system. Also an instrument used to make tiny writing, etching, or engravings.
An instrument consisting essentially of a tube 160 mm long, with an objective lens at the distant end and an eyepiece at the near end. The objective forms a real aerial image of the object in the focal plane of the eyepiece where it is observed by the eye. The overall magnifying power is equal to the linear magnification of the objective multiplied by the magnifying power of the eyepiece. The eyepiece can be replaced by a film to photograph the primary image, or a positive or negative relay...
The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
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