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MM-16 Spectroscopic Ellipsometer
Apr 2007
HORIBA ScientificRequest Info
Horiba Jobin Yvon introduces the new MM-16, a highly accurate and affordable spectroscopic ellipsometer. Along with measurements of thin-film thickness and optical constants, the MM-16 delivers -- in two seconds -- the complete 16 elements of the Mueller matrix in the visible to near-infrared spectral range (420 nm – 850 nm).

Combined with the embedded analysis software DeltaPsi2, this additional capability allows easy characterization of retardation, anisotropy and degree of depolarization. These complex materials properties are widely used in TFT-LCD (thin-film transistor LCD) and OLED (organic LED) structures.

With the addition of an automatic variable angle of incidence and a computer-controlled X-Y mapping stage, the MM-16 is the ideal spectroscopic ellipsometer for simple, fast and accurate measurements of your multilayer film thickness and optical constants.


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A spectrometer equipped with polarizing prisms and retardation plates that is used in the analysis of elliptically polarized light, mostly in the study of thin, evaporated films.
Pertaining to optics and the phenomena of light.
The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
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