Request InfoASE Optics LLC (See Rochester Precision Optics)Ase Optics Inc. has developed a unique non-contact scanning metrology instrument capable of measuring the surface profile and optical thickness of 3-D objects at a spatial resolution of 25 µm and a measurement accuracy of 100 nm. The instrument features a commercial Lumetrics OptiGauge that utilizes low coherence dual-wavelength interferometry technology originally invented at Eastman Kodak Co. to simultaneously measure the optical thickness of all layers within multilayer materials.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra August 2023 IssueSemiconductor Metrology ToolThe FRT MicroProf® PT from FormFactor Inc. is a metrology and inspection system for high-throughput panel measurement in advanced packaging. 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