iVista Digital Microscope
Jul 2007SUSS MicroTec AGRequest Info
GARCHING, Germany, July 23, 2007 -- Suss MicroTec AG said its new iVista high-resolution digital microscope significantly improves the productivity of operators and engineers -- who are increasingly faced with rapid device design changes that result in instruments with extremely complex circuitry and high numbers of contact pads -- by providing a powerful microscopy solution.
The unique design of the microscope delivers images with sharpness comparable to a 16-MP color CCD. This means that even the tiniest features are quickly and easily identifiable, and up to 40X digital zooming provides more detail and not just a pixilated image, the company said.
The iVista microscope allows the user to save the full-resolution image and the multiview screen for documentation. It also provides accurate point-to-point measurement and navigation using standard objectives, which eliminates the need to buy additional objectives or autorecognition adapters, according to Suss MicroTec.
The iVista enables several additional software features in the Spectrum Vision System from Suss. Multiview allows the user to create several freely-defined regions that are magnified and displayed alongside the main view, enabling live observation of specified areas without losing the "big picture." Multicam imaging displays a live image from a separate camera alongside the live image from the iVista microscope. The user can then, for example, monitor contact height with the view from the patented ContactView system while observing the position of the wafer and probe tips, the company said.
"The iVista microscope delivers the high resolution and software tools necessary for wafer-level testing applications like device characterization, reliability test and failure analysis," said Rob Carter, vice president of sales and marketing for the test systems division at Suss MicroTec. "Users of the microscope are always amazed at how easy routine tasks, such as aligning a probe card, become with the iVista. Managers will also benefit from the productivity gains that can be realized with such a powerful tool."
The system can be fully integrated with Suss semiautomatic probe stations for maximum convenience and wafer navigation but can also be used with a manual station or as a stand-alone microscope.
For more information, visit: www.suss.com; e-mail: firstname.lastname@example.org
Suss MicroTec AG
Schleissheimer Str. 90
D 85748 Garching
Fax: +49 89-32007-162