Request InfoVeeco Instruments Inc.Veeco Instruments Inc. has announced a series of enhancements to its Dimension X3D automated atomic force microscope. The upgrades include improvements to critical-dimension precision, 3-D profile metrology and line edge roughness metrology. The device’s depth metrology also has been enhanced with low-wear probe designs, such as carbon nanotubes, to improve lifetimes and the ability to measure smaller features such as nanoimprint masks.See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 8/8/2022Elevator StagesThe DAG20-120-01 and the DAG20-120-04 motorized elevator stages from Optimal Engineering Systems Inc. are high-resolution, compact, low-profile devices with high-stability 120- × 120-mm tables...Photonics.com 2/29/20243D Measuring DeviceThe FocusX from Bruker Alicona is an optical 3D measuring device meant for applications where highly reflective surfaces, steep flanks, and complex forms must be measured. 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