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Ultima IV X-ray Diffractometer
Sep 2007
Rigaku Americas Corp.Request Info
THE WOODLANDS, Texas, Sept. 4, 2007 -- The Ultima IV x-ray diffractometer is an advanced general purpose x-ray diffraction (XRD) instrument for materials science, semiconductor, and nanotechnology research and development, as well as for manufacturing quality assurance applications, according to its maker, Rigaku Americas Corp.

The design features a new high-speed detector for 100 times faster measurements, application flexibility provided by patented Cross Beam Optics (CBO), and a 50 percent smaller size than a conventional XRD system, the company said.

RigakuUltima.jpgA fully optioned Ultima IV can span applications that would have required up to four separate conventional XRD instruments in the past, Rigaku said. A modular "build-up" platform allows users to add additional capabilities as new application requirements arise, including support for high-resolution diffraction, thin-film measurement, microdiffraction and handling very small samples.

Ultima IV is equipped with a unique CBO mechanism that allows user-selectable switching between either a focusing or parallel incident x-ray beam without resetting or realigning the optical system. Both system geometries are permanently mounted and permanently aligned to allow easy changeover for different applications. All other competitive x-ray diffraction systems require system reconfiguration when switching operation of the system between focusing and parallel beam geometries. In addition, new optics for microdiffraction provides data quality close to that provided by a dedicated microdiffraction system.

The Ultima IV, which measures 1100-mm wide, 810-mm deep and 1630-mm high, is also more efficient that a conventional XRD instrument, occupying 50 percent less space and having 20 percent less mass. A reduce footprint means lower facilities overhead for a reduced cost-of-ownership. In addition, the sample stage height is 300 mm lower than a conventional XRD system for ease-of-use, Rigaku said.

For more information, visit:; email:

Rigaku Americas Corp.
9009 New Trails Dr.
The Woodlands, TX 77381
Phone: (281) 362-2300
Fax: (281) 364-3628


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As a wavefront of light passes by an opaque edge or through an opening, secondary weaker wavefronts are generated, apparently originating at that edge. These secondary wavefronts will interfere with the primary wavefront as well as with each other to form various diffraction patterns.  
A measurement device used to study the structure of matter using the diffraction of electromagnetic radiation.
The use of atoms, molecules and molecular-scale structures to enhance existing technology and develop new materials and devices. The goal of this technology is to manipulate atomic and molecular particles to create devices that are thousands of times smaller and faster than those of the current microtechnologies.
Pertaining to optics and the phenomena of light.
The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
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