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Optical Vector Analyzer ELp

Photonics.com
Nov 2007
Luna TechnologiesRequest Info
 
For Fiber Optic Polarizaton Characterization
ROANOKE, Va., Nov. 9, 2007 -- Luna Technologies, a division of Luna Innovations Inc., has expanded its fiber optic test platform with an optical vector analyzer (OVA) ELp designed to characterize the polarization properties of fiber optic components for high-speed optical networks. Using the industry standard for measuring polarization mode dispersion (PMD), the OVA ELp offers a dynamic range of more than 50 dB and performs with a single sweep of a tunable laser.

lunaelp.jpgThe OVA ELp is suitable for loss and polarization characterization of passive optical components in the S, C and L communication bands and ports easily from the lab to the manufacturing floor. When used with an external tunable laser, it measures critical component performance indicators such as insertion loss (IL), polarization dependent loss (PDL), polarization mode dispersion (PMD), second-order PMD, Jones matrix elements, TE/TM-loss and time domain or filter impulse information. Test and measurement upgrades, such as chromatic dispersion, group delay and phase, are available.

The base price of the ELp is $45,000; delivery is typically in four to six weeks.

For more information, visit: www.lunatechnologies.com/about_luna/contact.html; e-mail: support@lunatechnologies.com

Luna Technologies
3157 State Street
Blacksburg, VA 24060

Phone: (540) 961-5190
Product support: (866) LUNA OVA (586-2682)
Fax: (540) 961-5191


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ELpfiber optic testfiber opticsindustrialLuna InnovationsLuna Technologiesoptical vector analyzerOVAphotonicspolarization mode dispersionProducts

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