Request InfoFor Nanoscale Electromechanical MeasurementsOxford Instruments Asylum ResearchSANTA BARBARA, Calif., Nov. 29, 2007 -- In the last decade, piezoresponse force microscopy (PFM) has emerged as the preeminent tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric materials. In response to the growing applications for electromechanical imaging and spectroscopy, Asylum Research said it has developed the new Piezo Force Module, which enables very high sensitivity, high bias, and crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. It is exclusively available for the company's MFP-3D atomic force microscope (AFM). "Electromechanics and PFM is...See full productRelated content from Photonics MediaPRODUCTSPhotonics Showcase November 2023 IssueQS-PLL™ AFM ControllerThe QS-PLL™ AFM controller is designed for use with AFM resonant probes. 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