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SURFACE MEASUREMENT

Photonics Spectra
Jan 2008
PhaseViewRequest Info
 
PhaseView_MICROPHASE---2C.jpgPhaseView USA has announced new features on its optical devices that are used for 3-D surface measurement. The MicroPhase and SurPhase models now integrate color visualization and processing for better default discrimination and 3-D analysis. The extended dynamic range permits a large Z-measurement scale while maintaining high precision. The new hardware design enables 3-D measurement not only on the microscopic scale but also in the macroscopic mode for large samples. The software interface includes new 3-D measurement functions. Based on proprietary and patented digital phase technology, and relying on fully digital algorithms, the devices measure profile, height, roughness and waviness parameters.


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macroscopic modeNew Productsoptical devicesPhaseView USATest & Measurement

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