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CarryScope Mobile SEM
Jan 2008
JEOL USA Inc.Request Info
PEABODY, Mass., Jan. 14, 2008 -- JEOL USA Inc. said its new CarryScope is a mobile scanning electron microscope (SEM) that can travel or be easily moved to different locations as needed.

According to the company, the CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the research or manufacturing setting, the CarryScope can be transported between the lab, conference room or office for inspection of products or analysis of research samples.

CarryScope.jpgThe CarryScope also delivers several high-resolution performance imaging and analytical capabilities available on conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images.

Standard features include 8X to 300,000X imaging and up to 5.0-nm resolution. The CarryScope produces a sharp image that makes it possible to conduct and annotate high precision measurements on sub-µm structures, JEOL said.

The optional eucentric motorized specimen stage holds a specimen up to 150 mm (6 in.) in diameter. Other options include low vacuum, EDS compatibility, and multiple live image display, including picture in picture. A stage navigation system and SmileShot software with smart settings for routine imaging further enhance the capabilities of this small footprint SEM, the company said.

JEOL said it will demonstrate the CarryScope at the Pittcon Conference and Expo 2008, March 3-6, at Booth 4120/4121. The company said it is offering the product at a special low price until March 31, 2008.

For more information, visit:; e-mail:

11 Dearborn Rd.
Peabody, MA 01960
Phone: (978) 535-5900
Fax: (978) 536-2205


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