Feb 1999DataRay Inc.Request Info
DataRay Inc. has introduced BeamM2 AP, a compact beam profiler with diagnostic capabilities. It features simultaneous measurement of M2 beam quality, focus position, beam-waist diameter and axial alignment to solve problems in the adjustment and verification of tightly focused laser beams. The BeamM2 can measure preset pass/fail criteria to submicron accuracy at >5-Hz update rate. It is suited for developing and producing precision-focused laser assemblies for applications such as disc or wafer characterization and laser printing.