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CHARACTERIZATION SYSTEM

Photonics Spectra
Mar 2008
Imagine OpticRequest Info
 
ImagineOptic.jpgImagine Optic SA has unveiled the SL-Sys neo, a system for the characterization of miniature optical components ranging from 1 to 12 mm in diameter. The fully automated product houses a dual-wavelength wavefront sensor functioning at 532 and 635 nm and is available with a microlens array resolution of 32 × 40 or 76 × 100, depending on the model. It offers a ±45° field angle and better than 0.5% focal measurement sensitivity, and it uses a Windows XP interface.


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