Request InfoSICK Inc.MINNEAPOLIS, Minn., March 20, 2008 -- Sick Inc. said its new HLG automation light-grid sensor features high resolution and fast switching speeds, making it ideal for part counting and leading-edge detection on a conveyor. The HLG offers a higher resolution than the company's existing ELG light grids, resulting in a much smaller minimum detectable object (MDO) size of 2 mm, Sick said. The HLG is a through-beam style switching light grid; according to the company, the sensor provides a fast and reliable switching output any time one of the beams is blocked. The HLG is self-sufficient, Sick said, with no external controller...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra October 2023 IssueWafer Measurement SystemThe NEXIV VMZ-NWL 200 from Nikon is an automatic wafer measurement system developed to solve the challenges of wafer metrology in the back-end of the semiconductor manufacturing process. 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