Characterization System Tests Miniature Optics
May 2008Imagine OpticRequest Info
• ±45° field angle
• >0.5% sensitivity
• Windows XP
Imagine Optic SA has introduced the SL-Sys neo, a characterization system for testing miniature optics and optical components, typically composed of lenses ranging from 1 to 12 mm in diameter, that are used in consumer electronics devices such as DVD players and digital cameras. The fully automated system houses a dual-wavelength wavefront sensor functioning at 532 and at 635 nm and is available with a microlens array resolution of 32 × 40 or 76 × 100, depending upon the model. It offers a 45° field angle and better than 0.5% focal measurement sensitivity.
Running on Windows XP, the system provides full optical characterization of the lens or objective, including the back focal length, the effective focal length, the best focal plane, and total aberrations and optical quality as well as a complete 3-D modulation transfer function on-axis and anywhere within the field of view. It can measure chromatic effects as well as field curvature and distortion.
It can be used on the production line for online quality control to identify defective optics and to locate the origin of a problem within the assembly. Testing the individual optical elements that make up the objective enables the elimination of defective pieces before construction.