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CMOS Sensors Produce Low Noise

EuroPhotonics
Jul 2008
AwaibaRequest Info
 
•  12.2-bit A/D conversion
•  programmable gain from  26 to 20 dB
•  100% fill factor

AWAIBA.jpgThe Dragster digital line-scan CMOS sensor series has been released by Awaiba Lda. The DR-4k-7 model offers a 1 × 4k array of 7 × 7-μm pixels, 12.2-bit analog-to-digital (A/D) conversion, global shutter for interleaved integration and readout, and programmable gain from 26 to 20 dB. All models in the series have identical basic readout and control electronics.

The sensor produces low noise and has a 40-MHz pixel clock for a rate of 160 megapixels per second. It features a 100% fill factor, maximum quantum efficiency of 70% at 630 nm, trigger delay of 1 μs and maximum power consumption of 800 mW. It is compliant with the EMVA 1288 standard and is supplied in a chip-on-board module that comprises all decoupling elements.

Each pixel has an on-pixel analog-to-digital converter and a 13-bit readout register. The readout is made by two 12-bit-wide digital taps organized in odd/even order for each 2k segment. For each line, all 2k pixels must be read out because the minimum time for the A/D conversion equals approximately the time for a full readout.


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