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AFM for Nanoscale Imaging
Jun 2008
Veeco Instruments Inc.Request Info
PLAINVIEW, N.Y., June 2, 2008 – Veeco has announced a new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis. The HarmoniX nanoscale material property mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution quantitative material property maps.

According to David Rossi, vice president and general manager of Veeco’s Nano-Bio AFM Business, "HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously impossible. Our product scientists and engineering team collaborated with Dr. Ozgur Sahin, of the Rowland Institute at Harvard, to develop and bring this new patented technique to market.”


HarmoniX's high-resolution quantitative property maps.

Dr. Bede Pittenger, Veeco development scientist, added, “HarmoniX provides an AFM user the ability to simultaneously capture quantitative maps of material properties, such as elasticity, adhesion, dissipation and peak force.”

The HarmoniX mode is now available on all Veeco scanning probe microscopes that are powered by the new NanoScope V controller, including the MultiMode V, Dimension V, and BioScope II.

For more information, visit:

Veeco Instruments Inc.
Corporate Headquarters
Terminal Drive
Plainview, NY 11803
Phone: (516) 677-0200
Fax: (516) 714-1200




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AFMatomic force microscopeBasic ScienceDavid RossiDr. Bede PittengerHarmonixMicroscopynanoscale imagingphotonicsProductsquantitative material property mapsVeeco

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