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Hamamatsu Corp. - Earth Innovations LB 2/24

AFM for Nanoscale Imaging

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Veeco Instruments Inc.
PLAINVIEW, N.Y., June 2, 2008 – Veeco has announced a new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis. The HarmoniX nanoscale material property mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution quantitative material property maps. According to David Rossi, vice president and general manager of Veeco’s Nano-Bio AFM Business, "HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously...See full product

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