Request InfoVeeco Instruments Inc.PLAINVIEW, N.Y., June 2, 2008 – Veeco has announced a new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis. The HarmoniX nanoscale material property mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution quantitative material property maps. According to David Rossi, vice president and general manager of Veeco’s Nano-Bio AFM Business, "HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously...See full productRelated content from Photonics MediaPRODUCTSPromoted Content March 2023 IssueMad City Labs GmbH - Tools for the NanoscaleMad City Labs provides tools for the nanoscale for applications in photonics, microscopy, and physics. Our portfolio includes closed loop piezo nanopositioners, micropositioners, atomic force...Promoted Content June 2023 IssueNanopositioning for High-Res MicroscopyPI's new Fast Focus Stages and Multi-Axis Piezo Flexure Scanners for Microscopy are designed to improve the performance of high-resolution microscopy. Choice of piezo and voice coil motors....Promoted Content March 2024 IssueMadAFM™ sample scanning AFMThe MadAFM™ is a new multimodal sample scanning AFM. Simple to install with compact tabletop design. Includes Mad City Labs picometer precision nanopositioning systems to give outstanding AFM...Promoted Content September 2023 IssueTools for the NanoscaleMad City Labs provides tools for the nanoscale for applications in photonics, microscopy and physics applications. 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