Request InfoOptikos CorporationAn infrared laser unequal path interferometer that operates at a wavelength of 3.39 μm has been developed by Optikos Corp. Featuring an internal HeNe infrared laser and an integral collinear visible alignment one, it is suitable for testing mid-wave infrared imaging systems of any size or complexity. The 25-mm collimated output beam can be used as is to measure the transmitted wavefront quality of optical materials or the reflected wavefront quality of planar surfaces.See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 7/14/2023Bar StacksThe QCW Bar Stacks series from Lumispot Tech features high-power semiconductor lasers with a compact structure and various array configurations. The bar stacks utilize gold tin hard soldering...Photonics.com 5/2/2022Additive Manufacturing Laser Measurement SystemThe Ophir® BeamPeek™ from MKS Instruments Inc. is an integrated beam analysis and power measurement system for additive manufacturing. 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