Feb 2009McPhersonRequest Info
McPherson Inc. has introduced the 251MX x-ray and extreme ultraviolet (EUV) spectrometer for wavelength dispersive spectral measurements from 0.6 to 20 nm. A selection of diffraction gratings provides corrected flat-field spectra, and data is acquired quickly via direct-detection CCDs. The stainless steel chamber and vacuum-prepared internal components enable efficient pumping for high- and ultrahigh-vacuum applications. Gratings for 0.6 to 6 nm and for 5 to 20 nm have square groove profiles, and the laminar design reduces the effects of high diffracted orders.