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JEM-ARM200F Microscope

Photonics.com
Mar 2009
JEOL USA Inc.Request Info
 
PEABODY, Mass., March 12, 2009 – JEOL USA Inc. has introduced the JEM-ARM200F atomic resolution analytical microscope. The 200-kV spherical aberration-corrected scanning/transmission electron microscope (S/TEM) achieves a high angle annular dark-field resolution of 80 pm, or 0.08 nm. Maximum accelerating voltage is 200 kV, and maximum tilt angle is ±25°.

With advanced analytical capabilities, the instrument enables both atom-by-atom imaging resolution and good spatial resolution for atom-to-atom chemical mapping of materials. The new electron column design integrates S/TEM with aberration correction for atomic spatial energy resolution combined with high probe currents for microanalysis.  JEOL_ARM200F.jpg

The microscope offers high stability for imaging and analysis at the subnanometer scale.  The electron column is isolated from the environmental disturbances found in most labs, and an advanced shielding design safeguards the ultrahigh-power optics from airflow, vibration and acoustical interference. Additional shielding protects against electronic interference, magnetic fields and thermal fluctuations. 

Scanning transmission image magnification is from 100× to 150,000,000×; transmission image magnification is from 50× to 2,000,000×.

The latest in software automation has been designed into the microscope, with tomography and holography simplified by a user-friendly graphical user interface.

Optional accessories include an energy-dispersive x-ray spectrometer, an electron energy-loss spectrometer and a CCD camera.

For more information, visit: www.jeolusa.com 

JEOL USA Inc.
11 Dearborn Road
Peabody, MA 01960
Phone: (978) 535-5900
Fax: (978) 536-2205



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acceleratomg voltageatom-by-atom imaging resolutionatomic resolutionatomic spatial energy resolutionBasic SciencebiophotonicsCCD camerachemical mappinghigh angle annular dark-field resolutionJEM-ARM200FJEOLmaximum tilt anglemicroanalysisMicroscopyphotonicsProductsS/TEMscanning/transmission electron microscopespectroscopythermal fluctuationstomographyultrahigh-power opticsx-ray spectrometer

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