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Project Plus Software
Mar 2009
WITec GmbHRequest Info
for chemometric data evaluation
SAVOY, Ill., March 23, 2009 – For Raman spectral and microscopic data analysis, WiTec Instruments has released the WiTec Project Plus software package, which performs advanced data evaluation and chemometric image processing. It features various tools for multivariate data analysis in the fields of confocal Raman imaging and scanning probe microscopy, such as cluster analysis and principal component analysis.

WITec_software.jpgHidden structures in the images can be visualized automatically, leading to quick and consistent interpretation of the data. A variety of advanced patent-pending analysis tools and algorithms enable comprehensive and user-friendly computerized data evaluation and image generation.

The extensive calculations behind the various algorithms and procedures can be executed quickly. Project Plus can be obtained as an add-on package for the WiTec Project data evaluation software. It performs chemical, structural and optical imaging at high resolution and supports a number of microscopic techniques, measurement modes and microscope models.

In confocal Raman imaging, a complete Raman spectrum is acquired at each image pixel, resulting in images consisting of tens of thousands of spectra. The company’s microscope series allows the combination of Raman imaging with atomic force microscopy for more comprehensive investigation of a sample.

For more information, visit:

WITec Instruments Corp.
101 W. Tomaras Ave.
Suite 74
Savoy, IL 61874-9547
Phone: (217) 351-9705
Fax: (217) 352-6655


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Basic ScienceBiophotonicscanning probe microscopyhemometric image processingiTec Project Plusluster analysisMicroscopyoftwareonfocal Raman imagingphotonicsProductsrincipal component analysistomic force microscopyWiTec Instruments

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