Search
Menu
Zurich Instruments AG - Boost Your Optics 1-24 LB

QDI 2010

CRAIC TechnologiesRequest Info
 
Facebook X LinkedIn Email
Film microspectrophotometer
Craic Technologies Inc. has unveiled the QDI 2010 Film microspectrophotometer, designed for rapid noncontact and nondestructive measurement of the thickness of thin films of submicron sampling areas. It analyzes films of many materials on both transparent and opaque substrates and enables the user to determine thin film thickness on semiconductors, microelectromechanical systems devices, disk drives and flat panel displays. With proprietary contamination imaging capabilities, the instrument is designed specifically for industrial processes.

Craic_QDI-2010.jpgThe system combines advanced microspectroscopy with sophisticated QDI FilmPro software to enable the user to measure film thickness by either transmission or reflectance of many types of materials and substrates. Sampling areas can range from more than 100 to less than 1 µm. Designed for the production environment, it incorporates a number of easily modified processing recipes, data analysis tools and the ability to create new film recipes. The capability for direct imaging and analysis of films with ultraviolet microscopy also can be added to this instrument.

Spectra and images can be taken from the deep-UV to the near-IR, and microspectra and images can be acquired in absorbance, reflectance, polarization and fluorescence. The integrated thermoelectrically cooled array detector provides low noise and long-term stability.

Applications include organic LEDs, flat panel color masks, semiconductor film thickness and optical components.

For more information, visit: www.microspectra.com  

Craic Technologies Inc.
948 N. Amelia Ave.
San Dimas, CA 91773
Phone: (310) 573-8180
Fax: (310) 573-8182


Published: April 2009
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to CRAIC Technologies by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Photonics Marketplace
Looking for Substrates? There are 54 companies listed in the Photonics Buyers' Guide.
Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.
ConsumerCraic Technologiesdeep-UV to near-IRindustrialMicroscopymicrospectrophotometernoncontact measurementnondestructive measurementphotonicsProductsQDI 2010 FilmSensors & Detectorssubmicron sampling areasTE-cooled array detectorthin film thickness measurementtransmission or reflectancetransparent and opaque substrates

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.